- Overview: Our x-ray diffraction facility houses two x-ray diffractometers as well as a suite of analysis tools to structurally characterise powders, thin films and coating, solid materials and single crystals.
- Contact name: Dr Faye Esat, Facility Manager
- Phone: +44 (0)113 343 4142
- Email: firstname.lastname@example.org
Our aim is to produce world-class structural analysis on a wide range of materials to improve the understanding of a materials physical and chemical behaviour such as electrical, thermal, magnetic and mechanical properties. By determining the spacing between crystal lattice planes and the length scales over which they persist, we are able to determine the 3D atomic structure of materials.
We have several x-ray diffractometers which can be operated in many different modes. All modes reveal different information about the material such as:
- Residual stress analysis - Determine residual stress within the structure to better understand the physical properties
- Texture (preferred orientation) analysis - Study preferential ordering and epitaxial growth of crystallites (such as thin films or single crystals)
- Bragg-Brentano - Phase identification in crystalline and non-crystalline materials as well as quantification of phases within mixtures
- Line broadening - Determination of crystallite size
- Hot and cold stage analysis - To study the effect of different temperatures on the structure and crystalline nature of a material
- Reflectometry – To characterise surfaces, thin films and multilayers
Specialist research areas
- Thin films
- Composite materials
Our facilities can be broken down into the following categories:
Bruker D8 Diffractometer with full sized goniometer class powder XRD under ambient conditions.
- Capillary stage holders for transmission
- Solid sample capabilities
- Powder holders
PANalytical X’Pert PRO for high-throughput, high-quality phase identification and quantification, residual stress analysis, grazing incidence diffraction, X-ray reflectometry, small-angle X-ray scattering and non-ambient diffraction.
- Hot stage upto 1000°C
- Cold stage +100°C down to -190°C
- Point focus and line focus x-ray source
- All-in-one HighScore Plus software suite
- Rietveld methods
- Profile fitting
- Pattern treatment
- Access to annually updated ICDD (International Centre for Diffraction Data)
- Crystal Maker, Single Crystal and Crystal Diffract software modelling
Who can use the facility?
If you require x-ray diffraction analysis we can advise on the most appropriate modes of operation for you needs at the right cost.
We have highly trained and qualified personnel with the necessary experience to provide high quality, friendly and comprehensive service to both academic and industrial users.
To discuss your requirements please contact: Dr Faye Esat, Facility Manager, t: +44(0)113 343 4142, e: email@example.com